Shearography-Based Near-Surface Defect Detection in Composite Materials: A Spatiotemporal Object Detection Neural

Guanlin Li1,2, Yao Hu1,2, Hao Wang1,2

  • 1School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China.

Summary

This study introduces YOWO_SS3D, a neural network for shearography defect detection using simulated data. It achieves high accuracy (96.99%) without costly experimental data, significantly outperforming existing methods.

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