THRU-REFLECT Method for Scattering Parameter Extraction from Back-to-Back Measurements of Waveguide Components.

Area of Science:

• Electrical Engineering
• Electromagnetics
• Microwave Engineering

Background:

• Waveguide component design verification often relies on back-to-back measurements of paired units.
• Extracting individual device characteristics from these measurements is challenging.

Purpose of the Study:

• To present a simple method for extracting scattering parameters of individual waveguide components.
• To enable accurate characterization from back-to-back measurements.

Main Methods:

• Utilizes back-to-back measurements with minimal waveguide mating connections.
• Employs one reflection measurement with an offset SHORT and two transmission measurements with a THRU configuration.
• Derives a singular condition in S-parameter extraction equations to determine optimal standard lengths.

Main Results:

• A novel method for extracting scattering parameters (S-parameters) of waveguide components is proposed.
• The method simplifies the measurement process, requiring only three connections.
• Numerical simulations demonstrate the effectiveness of the method for a broadband coax-to-waveguide transition.

Conclusions:

• The proposed method offers a simplified and effective approach to waveguide component characterization.
• Accurate S-parameter extraction is achievable from back-to-back measurements.
• This technique aids in the design and verification of new waveguide components.