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Updated: Jun 27, 2026

High Pressure Single Crystal Diffraction at PX^2
Published on: January 16, 2017
Crystal growth and characterization of 1-inch GTAGG: Ce single crystal for sub-micron resolution synchrotron
Kazuya Omuro1,2, Masao Yoshino3,4, Liudmila Gushchina5
1Graduate School of Engineering, Tohoku University, 6-6 Aramaki Aza Aoba, Aoba-ku, Sendai, 980-8579, Miyagi, Japan. kazuya.omuro.r5@dc.tohoku.ac.jp.
Abstract:
A high-performance Ce3+-doped (Gd, Tb)3(Ga, Al)5O12 (GTAGG: Ce) single crystal was engineered and characterized, demonstrating a high application potential for advanced X-ray imaging. A transparent 1-inch diameter single crystal was grown using the Czochralski method, demonstrating a significant advancement in large-scale scintillator production. Comprehensive characterization using X-ray diffraction and electron probe micro-analysis confirmed the crystal's structural integrity. Photoluminescence and radioluminescence spectroscopy demonstrated efficient bidirectional energy transfer between Ce3+ and Tb3+ ions, a critical mechanism enhancing the performance of the scintillator. X-ray imaging tests were performed using crystals with a thickness of 100 μm at the Aichi Synchrotron Radiation Center. Comparison with the industry-standard LuAG: Ce scintillator showed that the GTAGG: Ce crystal produced 2.4 times higher light output and achieved a high spatial resolution of 0.85 μm. The results indicated that GTAGG: Ce is suitable for the next generation of high-performance X-ray imaging detectors in scientific and medical imaging applications.
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