Anchor point based image registration for absolute scale topographic structure detection in microscopy

Zhuo Diao1, Zijie Meng2, Fengxuan Li2

  • 1Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka, 560-0043, Japan. diao.zhuo.es@osaka-u.ac.jp.

Scientific Reports
|April 18, 2025
PubMed

Related Concept Videos