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In inductively coupled plasma–mass spectrometry (ICP–MS), an inductively coupled plasma (ICP) torch is used as an atomizer and ionizer. Solid samples are dissolved and volatilized before being introduced into the high-temperature argon plasma, while solution samples are nebulized and passed through the high-temperature argon plasma. Plasma dissociates the analytes and ionizes their component atoms to form a mixture of positive ions and molecular species. The positive ions are then...
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Inductively coupled plasma–mass spectrometry (ICP–MS) is a highly selective and sensitive technique for accurate elemental analysis. Though the analysis of ICP–MS mass spectra is comparatively straightforward, it is affected by spectroscopic and non-spectroscopic interferences. Spectroscopic interferences arise when the plasma contains ionic species with an m/z value the same as the analyte ion. Spectroscopic interference can be categorized as isobaric, polyatomic ions, and...
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Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Modeling, Validation, and Application of Instrument Response Function in the Form of Mixed Poisson Distribution for

Xinli Yang1,2, Hongwu Li1,2, Dexing Li1

  • 1CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing 100190, PR China.

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|April 22, 2025
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Summary

Single-particle inductively coupled plasma mass spectrometry (spICP-MS) accurately determines nanoparticle size and concentration. This study introduces a robust instrument response function (IRF) to improve nanoparticle size distribution (PSD) and particle number concentration (PNC) accuracy.

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Area of Science:

  • Analytical Chemistry
  • Materials Science
  • Nanotechnology

Background:

  • Single-particle inductively coupled plasma mass spectrometry (spICP-MS) is crucial for nanoparticle characterization in suspension.
  • Accurate event intensity distribution (EID) acquisition and modeling are vital for enhancing spICP-MS functionality and measurement precision.
  • Existing methods face challenges in precisely determining particle size distribution (PSD) and particle number concentration (PNC) due to signal broadening.

Purpose of the Study:

  • To explore factors causing broadening in event intensity distributions (EIDs) in spICP-MS.
  • To develop and validate a robust instrument response function (IRF) for improved nanoparticle characterization.
  • To enhance the accuracy of PSD and PNC measurements for nanoparticles, including mixtures and agglomerates.

Main Methods:

  • Established a mixed Poisson distribution as the instrument response function (IRF) to correlate PSD with EID.
  • Quantified and corrected EID tailing caused by particle coincidence using Monte Carlo simulations.
  • Applied IRF deconvolution to recovered EIDs for high-fidelity PSD determination and validated with transmission electron microscopy (TEM).

Main Results:

  • Successfully correlated PSD with EID across various operating conditions using the developed IRF.
  • Achieved high-fidelity PSD recovery, improving size resolution to approximately 7 nm for gold nanoparticles (AuNPs).
  • Demonstrated successful application of IRF deconvolution for measuring nanoparticle agglomerates and resolving agglomeration numbers.

Conclusions:

  • The developed IRF, based on a mixed Poisson distribution, significantly improves the accuracy of PSD and PNC measurements by spICP-MS.
  • IRF deconvolution effectively corrects for EID broadening, enabling precise characterization of monodisperse and mixed nanoparticle samples.
  • This advanced spICP-MS technique enhances high-throughput quantification of nanoparticle mixtures and agglomerates.