Comparing the Achievable Sensitivity Limits of Synchrotron-based X-ray Fluorescence Imaging versus conventional X-ray

Florian Grüner1, Jan Scheunemann1, Christoph Hoeschen2

  • 1University of Hamburg, physics department, and Center for Free-Electron Laser Science (CFEL), Luruper Chaussee 149, 22761 Hamburg, Germany.

Abstract