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Updated: May 10, 2025

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Speckle-Based Transmission and Dark-Field Imaging for Material Analysis with a Laboratory X-Ray Source
Diego Rosich1, Margarita Chevalier2, Tatiana Alieva3
1Physics Institute of Cantabria (IFCA-CSIC-UC), Av. de los Castros s/n, 39005 Santander, Spain.
Speckle-based X-ray transmission (T) and dark-field (DF) imaging enhance material analysis. Absorption coefficients from T images are universal for material discrimination, while DF images offer complementary insights.
Area of Science:
- Medical Physics
- Materials Science
- X-ray Imaging
Background:
- Multimodal imaging offers advantages over conventional bright-field (BF) imaging by providing additional data.
- Speckle-based techniques, including transmission (T) and dark-field (DF) imaging, can be implemented using widely available laboratory X-ray devices.
Purpose of the Study:
- To investigate the implementation and usefulness of speckle-based T and DF X-ray imaging for material analysis.
- To evaluate the impact of object-to-detector distance (ODD) and analysis window size on image quality and material characterization.
Main Methods:
- Three speckle-based methods were applied to recover T and DF images from a sample of six materials.
- Contrast-to-noise ratio (CNR), linear attenuation, absorption, and diffusion coefficients were analyzed for different ODDs and analysis windows.
- The unified modulated pattern analysis method was identified as the most reliable for image recovery.
Main Results:
- CNR of T and DF images increased with larger analysis windows, while absorption and diffusion coefficients remained constant.
- CNR of T images decreased with increasing ODD due to noise.
- Absorption coefficients derived from T images were independent of ODD and method, proving useful for material discrimination.
- Diffusion coefficients varied with ODD, limiting their universal applicability.
Conclusions:
- Speckle-based T and DF X-ray imaging provide complementary information for material analysis.
- Absorption coefficients derived from T images serve as a universal parameter for material discrimination.
- DF imaging, despite ODD-dependent variations in diffusion coefficients, offers valuable insights for distinguishing materials.
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