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Scanning Electron Microscopy01:07

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Related Experiment Video

Updated: May 10, 2025

Using Magnetometry to Monitor Cellular Incorporation and Subsequent Biodegradation of Chemically Synthetized Iron Oxide Nanoparticles
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Measuring Iron Oxide Composites with a Custom-Made Scanning Magnetic Microscope.

Christian D Medina1,2, Leonardo A F Mendoza3, Cleânio Luz-Lima4

  • 1Department of Physics, Pontificia Universidade Católica do Rio de Janeiro, Rio de Janeiro 22451-900, RJ, Brazil.

Sensors (Basel, Switzerland)
|April 26, 2025
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Summary

This study enhanced a scanning magnetic microscope with improved sensitivity and magnetic field mapping capabilities. The upgraded system achieved high magnetic moment sensitivity, enabling detailed analysis of magnetic materials.

Keywords:
Hall sensormagnetic measurementsscanning magnetic microscope

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Area of Science:

  • Materials Science
  • Physics
  • Nanotechnology

Background:

  • Scanning magnetic microscopy is crucial for characterizing magnetic materials at microscale.
  • Previous microscope designs had limitations in sensitivity and magnetic field application.
  • Vibrations can affect the precision of magnetic measurements.

Purpose of the Study:

  • To enhance a scanning magnetic microscope's performance.
  • To improve magnetic field mapping capabilities and sensitivity.
  • To enable detailed analysis of magnetic composites.

Main Methods:

  • Integration of a new detection system and enhanced mechanical structure.
  • Utilizing a differential arrangement of two Hall effect elements.
  • Calibration with a pure nickel sphere and sample fabrication with iron oxide microparticles.

Main Results:

  • Achieved a system sensitivity of 850 nTrms√Hz.
  • Demonstrated magnetic moment sensitivity of 10 nAm².
  • Successfully mapped magnetization curves of fabricated composite samples.

Conclusions:

  • The enhanced scanning magnetic microscope offers improved sensitivity and functionality.
  • The system is capable of detailed magnetic characterization of various materials.
  • The developed platform facilitates the study of magnetic composites and powders.