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Nonparametric inference for reversed mean models with panel count data
L I Liu1, Wen Su2, Guosheng Yin2
1School of Mathematics and Statistics, Wuhan University, Wuhan, Hubei, 430072, China.
Abstract:
Panel count data typically refer to data arising from studies with recurrent events, in which subjects are observed only at discrete time points rather than under continuous observations. We investigate a general situation where a recurrent event process is eventually truncated by an informative terminal event and we are particularly interested in behaviors of the recurrent event process near the terminal event. We propose a reversed mean model for estimating the mean function of the recurrent event process. We develop a two-stage sieve likelihood-based method to estimate the mean function, which overcomes the computational difficulties arising from a nuisance functional parameter involved in the likelihood. The consistency and the convergence rate of the two-stage estimator are established. Allowing for the convergence rate slower than the standard rate, we develop the general weak convergence theory of M-estimators with a nuisance functional parameter, and then apply it to the proposed estimator for deriving the asymptotic normality. Furthermore, a class of two-sample tests is developed. The proposed methods are evaluated with extensive simulation studies and illustrated with panel count data from the Chinese Longitudinal Healthy Longevity Study.
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