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Enhanced Vision-Based Quality Inspection: A Multiview Artificial Intelligence Framework for Defect Detection
Geethika Bhavanasi1, Davy Neven1, Manuel Arteaga1
1Flanders Make, Oude Diestersebaan 133, 3920 Lommel, Belgium.
Sensors (Basel, Switzerland)
|April 28, 2025
Summary
Multiview deep learning significantly improves automated defect detection on metallic surfaces. A novel early fusion method, MV-UNet, achieved the highest accuracy for identifying subtle defects like scratches.
Area of Science:
- Industrial Automation
- Computer Vision
- Machine Learning
Background:
- Automated defect detection is crucial for industrial quality control.
- Subtle defects, such as scratches on metallic surfaces, pose significant detection challenges.
- Current single-view inspection methods often lack the necessary accuracy for complex defect identification.
Purpose of the Study:
- To investigate the effectiveness of multiview deep learning for enhanced defect detection.
- To compare early and late fusion methodologies in a multiview context.
- To propose and evaluate a novel early fusion architecture, MV-UNet, for improved accuracy.
Main Methods:
- Implementation and comparison of late fusion and early fusion deep learning approaches.
- Development of MV-UNet, an early fusion architecture utilizing a transformation block for feature alignment and aggregation.
- Experimental evaluation on a metallic plates dataset, comparing against single-view inspection.
Main Results:
- Both early and late fusion methods demonstrated improved detection accuracy compared to single-view inspection.
- The proposed MV-UNet achieved the highest F1-score of 0.942.
- Adapted precision-recall metrics were introduced, offering more accurate evaluation for segmentation-based defect detection, especially for elongated scratches.
Conclusions:
- Multiview deep learning, particularly early fusion, offers significant advantages for industrial defect detection.
- MV-UNet provides a robust and scalable solution for enhancing the accuracy of automated quality control systems.
- The developed tailored metrics improve the evaluation of defect localization performance in challenging scenarios.
Keywords:
active visiondeep learningdefect detectionearly fusionlate fusionmultiview analysissegmentation
