Mechanistic Models: Compartment Models in Algorithms for Numerical Problem Solving
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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Andrea Bulgarelli1, Elia Cellini1, Karl Jansen2,3
1University of Turin and INFN, Department of Physics, Turin unit, Via Pietro Giuria 1, I-10125 Turin, Italy.
We developed a new method using generative models to calculate Rényi entanglement entropies in lattice quantum field theory. This technique improves upon existing Monte Carlo calculations for quantum systems.
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