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Updated: May 9, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Flow-Based Sampling for Entanglement Entropy and the Machine Learning of Defects
Andrea Bulgarelli1, Elia Cellini1, Karl Jansen2,3
1University of Turin and INFN, Department of Physics, Turin unit, Via Pietro Giuria 1, I-10125 Turin, Italy.
Abstract:
We introduce a novel technique to numerically calculate Rényi entanglement entropies in lattice quantum field theory using generative models. We describe how flow-based approaches can be combined with the replica trick using a custom neural-network architecture around a lattice defect connecting two replicas. Numerical tests for the ϕ^{4} scalar field theory in two and three dimensions demonstrate that our technique outperforms state-of-the-art Monte Carlo calculations, and exhibit a promising scaling with the defect size.
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