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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: May 9, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

3D Vector Piezoresponse Imaging with Interferometric Atomic Force Microscopy.

Roger Proksch¹, Ryan Wagner²

¹Asylum Research an Oxford Instruments Company, Santa Barbara, CA, 93117, USA.

|May 3, 2025

Summary

This summary is machine-generated.

This study introduces a new 3D interferometric method for Atomic Force Microscope (AFM) force measurements, simplifying complex workflows. The technique accurately quantifies tip-sample forces in three dimensions, particularly for piezoelectric materials.

Keywords:

Piezoresponse ferroelectric vector PFM

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Last Updated: May 9, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

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Published on: June 13, 2023

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

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Published on: December 20, 2016

Area of Science:

Materials Science
Nanotechnology
Physics

Background:

Atomic Force Microscope (AFM) force measurements are typically limited to 1D or 2D.
Existing 3D AFM force measurement methods are complex and time-consuming.

Purpose of the Study:

To develop an accurate, simplified interferometric method for quantifying the full 3D response of an AFM tip to localized forces.
To enable quantitative 3D force measurements independent of sample orientation.

Main Methods:

Demonstration of an accurate, interferometric technique for 3D AFM force quantification.
Application of the method to piezoelectric materials for validation.

Main Results:

The interferometric method provides quantitative 3D force measurements with reduced noise and high accuracy.
Vertical piezo sensitivity (d_eff,z) was found to be systematically 2-3x larger than in-plane sensitivities (d_eff,lat).
Measured stiffness ratios align with theoretical predictions based on material moduli.

Conclusions:

The developed method simplifies angle-resolved piezoresponse force microscopy (PFM).
This approach offers a general framework for various AFM-based mechanical measurements beyond ferroelectric materials.