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Updated: May 12, 2025

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Advanced Simulation of ITER Core X-ray Crystal Spectroscopy
Xinyi Jin1, Zhifeng Cheng2, Junli Zhang1
1State Key Laboratory of Advanced Electromagnetic Technology, International Joint Research Laboratory of Magnetic Confinement Fusion and Plasma Physics, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
Abstract:
X-Ray Simulation Analysis (XRSA) is an analytical ray-tracing mixed code developed specifically for the ITER Core X-Ray Crystal Spectroscopy (XRCS-Core) diagnostic, which employs a dual-reflection configuration incorporating multiple pre-reflectors made of Highly Oriented Pyrolytic Graphite (HOPG) and spherically curved analyzing crystals. The ITER XRCS-Core is designed for high spectral resolution measurement in specific wavelength ranges, including narrow bands around 1.354 Å for W64+, 2.19 Å for Xe51+, and 2.555 Å for Xe44+ and Xe47+, enabling diagnostic capability across a broad electron temperature range in the ITER plasma. XRSA facilitates efficient simulation of the spectral performance of this complex X-ray spectroscopic system. Recent updates to the XRSA code have incorporated two critical effects: auto-focusing, which specifically applies to HOPG, and polarization. These two effects are particularly important in the dual-reflection configuration used in the ITER XRCS-Core system to provide more accurate modeling results. Simulations conducted with the updated code demonstrate that polarization has a substantial impact on the performance of the dual-reflection system. Additionally, the combined influence of polarization and system layout introduces performance variations across channels through the same crystal.
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