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Updated: May 12, 2025

Plasma-assisted Molecular Beam Epitaxy of N-polar InAlN-barrier High-electron-mobility Transistors
Published on: November 24, 2016
Silicon orientations to grow semi-polar AlN
Ji-Li Li1, Ye-Fei Li2, Zhi-Pan Liu3,4
1State Key Laboratory of Porous Materials for Separation and Conversion, Collaborative Innovation Center of Chemistry for Energy Material, Shanghai Key Laboratory of Molecular Catalysis and Innovative Materials, Key Laboratory of Computational Physical Science, Department of Chemistry, Fudan University, Shanghai, 200433, China.
Abstract:
The growth of non-polar GaN on Si substrates is a grand challenge in developing light-emitting diodes, where AlN layers serve as buffers to mitigate the lattice mismatch between GaN and Si in practice. Even though, the primary difficulty aries from the predominant growth of polar AlN(0001) layers. Here we demonstrate that stepped Si(320) can establish a high-quality interface with the semi-polar AlN(22 ) as identified through machine-learning-based structure predictions that explored millions of potential interface configurations. This interface exhibits atomic-matching with low interface energy, and importantly, features reduced polarization (0.20 C/m2) along with superior interfacial thermal conductance (0.47 GWm-2K-1).
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