Atomic Force Microscopy
Overview of Microscopy Techniques
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: May 12, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Behnam Esmaeilzadeh1, Muhammad Touqeer1, Syed Asad Maqbool1
1High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, Anhui, China; University of Science and Technology of China, Hefei 230026, Anhui, China.
This study introduces a novel non-metallic scanning tunneling microscope (STM) with a mechanically isolated scanning unit. This design enhances imaging stability and precision for advanced materials research.
11:33All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
10:28Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy
Published on: May 27, 2018
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: