An improved soft-thresholding exit wave reconstruction for imaging beam-sensitive materials
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Updated: May 13, 2025

High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip
Published on: November 16, 2019
Hongsheng Shi1, Yuan Lu1, Zeyu Wang1
1School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China; Shanghai Key Laboratory of High-resolution Electron Microscopy, ShanghaiTech University, Shanghai 201210, China.
Abstract:
High-resolution transmission electron microscopy (HRTEM) is a widely-used technique for atomic-scale characterization. However, the conventional dose of HRTEM can destroy beam-sensitive materials such as organic-inorganic halide perovskites. CH3NH3PbI3 (MAPbI3), a typical perovskite, will be easily damaged after irradiated with the dose of ∼102 e-/Å2. Low-dose imaging techniques can protect the specimen but it is difficult to achieve an image which is both directly interpreted and atomically clear. Exit wave reconstruction (EWR), as one of phase retrieval methods, can recover an interpretable phase image at the atomic scale but its signal-to-noise ratio (SNR) is limited by low electron doses. Here, we improve the iterative wave function reconstruction (IWFR) method and present a soft-thresholding L1-IWFR. Results from both simulated and experimental focal-series dataset at the extremely low dose show that L1-IWFR improves the SNR effectively and has better performance on low-dose datasets than IWFR. Combined with low-dose imaging techniques and various alignment strategies, an atomically clear image of CH3NH3PbI3 (MAPbI3) is successfully achieved at the total dose of ∼45 e-/Å2.

