An improved soft-thresholding exit wave reconstruction for imaging beam-sensitive materials

Hongsheng Shi1, Yuan Lu1, Zeyu Wang1

  • 1School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China; Shanghai Key Laboratory of High-resolution Electron Microscopy, ShanghaiTech University, Shanghai 201210, China.

Ultramicroscopy
|May 11, 2025
PubMed

Related Concept Videos