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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Limei Zhang1, Yongqi Da2,3,4, Wei Zhang1
1Beijing Institute of Space Mechanics & Electricity, Beijing 100094, China.
Principal Component Analysis (PCA) effectively evaluates the output performance of shaped charge bursts (SCB). This method accurately assesses SCB ignition capabilities for lead styphnate (LTNR) under varying conditions.
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