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Multi-Angle Averaging Approach for Measuring the Coating Thickness on Thin Transparent Polymer Films
Friederike Münch1, Benedikt Hauer1, Ingo Breunig1,2
1Fraunhofer Institute for Physical Measurement Techniques IPM, Freiburg, Germany.
Applied Spectroscopy
|May 14, 2025
Summary
Inline measurement of nanometer-thin oxide coatings on polymer films is now more precise. This new method overcomes interference effects from varying film thickness, ensuring accurate barrier function assessment.
Area of Science:
- Materials Science
- Optical Engineering
- Surface Science
Background:
- Roll-to-roll coating systems apply nanometer-thin oxide layers to polymer films to enhance barrier properties like gas and water permeation.
- Maintaining precise coating thickness is critical for effective barrier function, necessitating inline quality control.
- Existing infrared reflection spectroscopy methods are challenged by interference effects from thin, weakly absorbing polymer substrates with variable thickness.
Purpose of the Study:
- To develop and validate a novel sensing principle for accurate inline measurement of nanometer-thin oxide coating thickness on polymer films.
- To address and overcome interference effects caused by variable polymer film thickness and backside reflections.
- To enable precise quality control for oxide-coated polymer films used in barrier applications.
Main Methods:
- Developed an infrared reflection measurement technique targeting specific oxide coating absorption bands.
- Implemented an approach averaging interference patterns obtained at multiple angles of incidence to mitigate substrate variations.
- Validated the method through calculations and measurements on industrial polymer film samples with oxide coatings.
Main Results:
- The developed approach effectively measures oxide coating thickness on polymer films with varying substrates.
- Achieved high precision ( nm) and accuracy ( nm) for coating thicknesses in the range of 5-100 nm.
- Demonstrated the potential for implementation in versatile and compact inline measurement systems.
Conclusions:
- Acoustic interferometry provides a robust solution for accurate inline thickness measurement of nanometer-scale oxide coatings on polymer films.
- The multi-angle incidence approach effectively compensates for substrate thickness variations and backside reflections.
- This technology is suitable for industrial inline quality control, ensuring the barrier performance of coated polymer films.

