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Updated: May 16, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Direct Visualization of Metal-Induced Gap State Distribution and Valley Band Evolution at Metal Versus Semimetal MoS2

Yi-Feng Chen1,2, Hung-Chang Hsu2, Hao-Yu Chen1

  • 1Graduate School of Advanced Technology, National Taiwan University, Taipei 10617, Taiwan.

ACS Nano
|May 15, 2025
PubMed
Abstract

Keywords:
contact engineeringinterlayer couplingmetal-induced gap statescanning tunneling microscopyvalley band modulation

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