Updated: May 17, 2025

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Keren Stein1, Gautham Vijayan1, Ron Bessler1
1Faculty of Materials Science and Engineering, Technion - Israel Institute of Technology, 3200003 Haifa, Israel. eladk@technion.ac.il.
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