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Updated: Jun 16, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Yu-Xiang Chen1,2,3, Jian-Jhang Lee1, Ding-Rui Chen4
1Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei, 10617, Taiwan.
Electron cloaking in 2D materials, using metal decoration of defects, enhances optoelectronic performance. This technique improves carrier mobility and lifetime, enabling highly sensitive and fast photosensors.
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