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Efficient, automated escape routing for high-density pad grids: deepest-exit-first algorithm for layer and wire count
Iakov Rachinskiy1, Dmitrii Rachinskii2, Jonathan Viventi1,3,4,5
1Department of Biomedical Engineering, Duke University, Durham, NC, United States of America.
A new algorithm efficiently routes dense neural interface grids, enabling more channels without increasing device size. This breakthrough is crucial for developing next-generation, high-channel-count neural implants.
Area of Science:
- Neuroscience
- Electrical Engineering
- Materials Science
Background:
- The demand for higher channel count neural interfaces is limited by connector size and fabrication constraints.
- Thin-film substrates offer potential but face challenges in routing dense electrode grids.
- Current methods create a trade-off between channel count, device size, and flexibility.
Purpose of the Study:
- To develop an efficient algorithm for routing dense pad grids in neural interfaces.
- To overcome fabrication limitations and enable higher channel counts in implantable devices.
- To address the challenge of mismatched pad density and metal feature size capabilities.
Main Methods:
- Proposed a novel algorithm for efficient routing of dense pad grids, even in worst-case scenarios.
- Demonstrated the algorithm's application on a 1024-channel electrode connected to a wireless recording integrated circuit.
- Compared the algorithm's performance against standard routing methods.
Main Results:
- The algorithm can route the theoretical maximum number of traces for large grids.
- Achieved improved efficiency in routable traces, number of layers, and footprint area compared to standard methods.
- Successfully applied to a 1024-channel neural interface design.
Conclusions:
- The developed algorithm efficiently routes dense grids, crucial for high-channel-count neural interfaces.
- This method shows promise for future very large channel count device designs.
- Automates the design process, accelerating iteration for neural interface development.
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