A guide for nanomechanical characterization of soft matter via AFM: From mode selection to data reporting

Atomic force microscopy (AFM) enables high-resolution mechanical characterization of soft materials at the nanoscale. It offers unique advantages over conventional mechanical testing methods by providing spatially resolved properties, requiring minimal sample preparation, and allowing measurements under controlled environmental conditions. This comprehensive guide provides a practical framework for conducting reproducible nanomechanical measurements on soft matter using AFM. Readers will learn how to select appropriate AFM modes, choose and calibrate suitable cantilevers, prepare samples, and optimize measurement parameters for soft materials. Four operational AFM modes are described: intermittent contact mode, nanomechanical imaging, force modulation, and force spectroscopy. We detail their principles, mechanisms, and trade-offs while offering practical advice for experiment execution, data analysis, and result reporting. This protocol seeks to guide researchers to execute consistent and comparable AFM measurements, bridge the gap between theoretical knowledge and practical implementation, and address key challenges in standardization and reproducibility within the field of soft matter nano-mechanics.