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Updated: Sep 19, 2025

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography
Published on: August 26, 2015
Mitigating X-ray-induced damage for accurate analysis of battery cathodes using transmission X-ray microscopy
Muhammad Mominur Rahman1, Nan Wang1, Xianghui Xiao2
1Chemistry division, Brookhaven National Laboratory, Upton, NY, 11973, USA. enhu@bnl.gov.
None:
We investigate the impact of X-ray-induced damage on the evolution of battery cathodes using synchrotron transmission X-ray microscopy. In an operando coin cell, exposure to the X-ray beam can induce bubble formation, potentially rendering cathode particles electrochemically inactive and displacing particles from their initial position. However, utilizing external pressure on a pouch cell can mitigate bubble formation and its associated effects.
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