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Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope

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Published on: February 28, 2019

Mechanical spectroscopy of materials using atomic force microscopy (AFM-MS).

M Petrov¹, D Canena¹, N Kulachenkov¹

¹Departments of Mechanical Engineering, Tufts University, Medford, MA 02155, USA.

Materials Today (Kidlington, England)

|June 2, 2025

Summary

We developed a new atomic force microscopy method (AFM-MS) using machine learning to map material composition at the nanoscale. This technique achieves 1.6 nm resolution, advancing nanostructured material analysis.

Keywords:

Atomic force microscopy (AFM)Composite Materials Machine Learning Material Identification NanoSpectroscopy Polymer composites

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Last Updated: Jan 18, 2026

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope

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Published on: February 28, 2019

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

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Published on: February 27, 2015

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

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Published on: March 16, 2020

Area of Science:

Materials Science
Nanotechnology
Analytical Chemistry

Background:

Current spectroscopic methods have limitations in nanoscale material characterization.
High-resolution imaging and material identification are crucial for understanding complex nanostructures.

Purpose of the Study:

To introduce a novel mechano-spectroscopic atomic force microscopy (AFM-MS) technique.
To overcome limitations of existing spectroscopic methods by integrating AFM imaging with machine learning (ML) classification.

Main Methods:

AFM-MS utilizes AFM in sub-resonance tapping imaging mode.
Collects multiple physical and mechanical property maps with sub-nanometer lateral resolution.
Employs ML algorithms to classify materials at each image pixel by comparing properties to a database.

Main Results:

Demonstrated AFM-MS on various material mixtures.
Achieved an unprecedented lateral spectroscopic resolution of 1.6 nm.
Successfully identified constituent materials at the pixel level.

Conclusions:

AFM-MS offers a powerful approach for nanoscale material study.
Enables material identification and correlation of nanostructure with macroscopic properties.
Significantly advances the understanding and design of complex, nanostructured materials.