Versatile X-ray reflector extension setup for grazing-incidence experiments at SAXS facilities for liquid surface study
Related Experiment Video
Updated: Sep 19, 2025

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
Published on: March 2, 2021
Andrei Chumakov1, Jan J Rubeck1, Matthias Schwartzkopf1
1Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany.
Abstract:
Existing beamlines for in situ grazing-incidence small-angle scattering on liquids are either limited in angular range or incompatible with the large sample-detector distance required for submicrometre resolution. We present a low-cost, easily assembled beam-tilting extension for synchrotron-based ultra-small-angle X-ray scattering (USAXS) facilities, enabling grazing-incidence and transmitted scattering (GIUSAXS, GTUSAXS) studies on liquid surfaces. The setup is compatible with standard USAXS beamlines and requires only ∼0.5 m of additional space at the sample stage. It allows X-ray beam incidence angles of up to ∼0.6° at the liquid surface, equal to twice the angle of incidence on a reflector and below its critical angle of typical materials (e.g. silicon, germanium, etc.), and provides access to a q-range of approximately 0.003-0.5 nm-1. The system was tested at P03 beamline (DESY) using polystyrene nanoparticles (∼197 nm) self-assembled at the air/water interface. The recorded GIUSAXS and GTSAXS patterns revealed features characteristic of near-surface hexagonally ordered monolayers and multilayer assemblies, validating the system's resolution and sensitivity. The proposed scheme enables selective depth profiling and expands the research capabilities of existing small-angle X-ray scattering synchrotron facilities for in situ studyies of submicrometre nanostructured objects at liquid surfaces under grazing-incidence geometry, while remaining fully compatible with complementary techniques such as grazing-incidence wide-angle scattering and total reflection X-ray fluorescence.

