Resolving Artifacts in Voltage-Clamp Experiments with Computational Modeling: An Application to Fast Sodium Current

Chon Lok Lei1,2, Alexander P Clark3, Michael Clerx4

  • 1Institute of Translational Medicine, Faculty of Health Sciences, University of Macau, Macau, 999078, China.

Summary

A new computational model predicts and corrects artifacts in patch-clamp voltage clamp experiments, improving the accuracy of ion channel behavior analysis for drug safety and disease research.