Electron Microscope Tomography and Single-particle Reconstruction
Scanning Electron Microscopy
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Updated: Jun 12, 2025

Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
Published on: August 10, 2019
Dal-Jae Yun1,2, Junhyeong Park1, Youngkwon Haam3
1Emerging Research Instruments Group, Strategic Technology Research Institute, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon 34113, Republic of Korea.
This study introduces a semi-supervised learning method to improve segmentation accuracy in serial block-face scanning electron microscopy (SBF-SEM) for detailed 3D organelle analysis, reducing manual annotation needs.
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