Three-Dimensional Reconstruction of Serial Block-Face Scanning Electron Microscopy Using Semantic Segmentation based

Dal-Jae Yun1,2, Junhyeong Park1, Youngkwon Haam3

  • 1Emerging Research Instruments Group, Strategic Technology Research Institute, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon 34113, Republic of Korea.

Abstract