Thickness and Wavelength Optimizations of a High-Performance SPR Sensor Employing a Silver Layer and Black Phosphorus...

In this paper, we propose an innovative approach based on the wavelength optimization of a light source for a simple, high-performance surface plasmon resonance (SPR) sensor utilizing comprehensive reflectance analysis in the angular domain. The proposed structure consists of a glass substrate, an adhesion layer of titanium dioxide, a silver plasmonic layer, and a 2D material. Analysis is performed in the Kretschmann configuration for liquid analyte sensing. Sensing parameters such as the refractive index (RI) sensitivity, the reflectance minimum, and the figure of merit (FOM) are investigated in the first step of this study as a function of the thickness of the silver layer together with the RI of a coupling prism. Next, utilizing the results offering a fused silica prism, the thickness of the silver layer and the wavelength of the light source are optimized for the structure with the addition of a 2D material, black phosphorus (BP), which is studied along different principal directions, the zigzag and armchair directions. In addition, a new approach of adjusting the source wavelength using a one-dimensional photonic crystal combined with an LED, is presented. Based on this analysis, for the reference structure at a wavelength of 632.8 nm, the optimized silver layer thickness is 50 nm, and the achieved RI sensitivity ranges from 193.9 to 251.5 degrees per RI unit (deg/RIU), with the highest FOM reaching 52.3 RIU^-1. In addition, for the modified structure with BP, the achieved RI sensitivity varies in the range of 269.1-351.2 deg/RIU at the optimized wavelength of 628 nm, with the highest FOM reaching 44.7 RIU^-1 for the zigzag direction. Due to the optimization and adjusting the wavelength of the source, the results obtained for the proposed SPR structure could have significant implications for the development of more sensitive and efficient sensors employing a simple plasmonic structure.