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    Area of Science:

    • Physics
    • Spectroscopy
    • Imaging Technology

    Background:

    • Millimeter-wave and terahertz hyperspectral imaging are crucial for industrial and security applications.
    • Existing systems face performance limitations hindering widespread adoption and impact.

    Purpose of the Study:

    • To introduce the first direct multi-spectral dual-comb imaging system in the millimeter-wave range.
    • To enable simultaneous retrieval of spatial and spectral information for enhanced material analysis.

    Main Methods:

    • Development of a novel multi-spectral dual-comb imaging system operating in the millimeter-wave frequency range.
    • Simultaneous acquisition of spatial and spectral data for comprehensive material characterization.

    Main Results:

    • Demonstrated the system's capability for accurate, high-resolution spectral measurements.
    • Validated real-time operation and adaptability for tailored applications through proof-of-concept experiments.
    • Achieved noteworthy performance levels in spectro-imaging characterizations of various materials.

    Conclusions:

    • The developed system addresses key technological weaknesses in current hyperspectral imaging.
    • This advancement offers accurate, high-resolution, and real-time spectro-imaging for diverse material analysis.
    • The system shows significant potential for industrial inspection, security, and other applications.