Electrothermal bidirectional coupling for pulsed thyristors with inductive load under repetitive pulses.

Area of Science:

• Electrical Engineering
• Materials Science
• Semiconductor Physics

Background:

• Pulsed thyristors are critical for high-power pulse generation.
• Thermal runaway and electrical instability limit their reliability under repetitive pulses.
• Bidirectional electrothermal effects in pulsed thyristors under repetitive conditions remain understudied.

Purpose of the Study:

• To investigate the bidirectional electrothermal effects in pulsed thyristors under repetitive pulse conditions.
• To identify critical regions of temperature rise and their dependence on pulse parameters.
• To establish a theoretical framework for electrothermal coupling in repetitive pulse operation.

Main Methods:

• Mixed semiconductor device and circuit simulations.
• Scaling experiments.
• Analysis of temperature distribution, voltage drop, power dissipation, and anode current.

Main Results:

• Maximum temperature rise location depends on diode protection (P2 region with, J1 junction without).
• Increased pulse width decreases maximum temperature but expands heating region.
• Higher repetition rates increase case temperature and affect electrical parameters (voltage drop, power dissipation, anode current).
• Residual temperature from previous pulses exacerbates heat generation in subsequent pulses.

Conclusions:

• The study establishes the bidirectional electrothermal coupling relationship under repetitive pulses.
• Findings provide guidance for optimizing the application of high-power pulse generators in repetitive mode.
• Understanding these effects is crucial for enhancing the reliability and performance of pulsed thyristor systems.