Leaky Scanning
Electron Microscope Tomography and Single-particle Reconstruction
Imperfections in Crystal Structure: Point, Line and Plane Defects
Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Non-Stoichiometric Defects
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Updated: May 13, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Yuan-Chao Hu1, Hajime Tanaka2,3
1Songshan Lake Materials Laboratory, Dongguan, 523808, China. yuanchao.hu@sslab.org.cn.
Researchers identified a "key-core" particle defect in glasses, responsible for low-frequency quasi-localised modes (QLMs). Pinning these defects reduces mechanical anisotropy in nanoscale glasses.
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