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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Tie-Lin Kong1,2, Jie Bie1,2,3, Zhuo Chen1,2
1National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing, Jiangsu 210023, China.
A new model simulates ferroelectric tunnel junction (FTJ) behavior for artificial intelligence (AI) computing. This method accurately predicts synaptic functions, accelerating AI hardware development.
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