High-resolution electron-multi-ion coincidence set-up for gas-phase experiments in the tender and hard X-ray range

The MUSTACHE setup (MUlti-STep photofragmentation studies by Auger electron-ion Coincidences using High Energy photons) is a high-resolution electron-multi-ion coincidence system optimized for gas-phase experiments in the tender (∼2-10 keV) and hard (>5 keV) X-ray range. The system integrates a high-resolution hemispherical electron analyzer with a Wiley-McLaren-type ion time-of-flight (TOF) spectrometer, enabling coincidence measurements of Auger electrons and high-energy photoelectrons. Designed to overcome challenges in high-energy electron detection while maintaining excellent energy resolution, the setup covers a broad kinetic energy range up to 5 keV, allowing investigation of hard-X-ray-induced Auger cascades in molecules containing high-Z elements, where initial fluorescence decay is followed by Auger processes within this 5 keV detection window. The ion TOF spectrometer provides high-resolution ion mass and momentum analysis, essential for studying light and fast ions generated by deep-core ionization. System capabilities are demonstrated through test measurements on benchmark atomic and molecular systems, such as argon, nitrogen and carbon disulfide. These measurements demonstrate energy-resolved high-kinetic-energy photoelectron-ion coincidences and momentum-resolved multi-ion coincidences following deep-core ionization and Coulomb explosion. MUSTACHE enables investigations into deep-core ionization, Auger cascade processes and Coulomb explosion dynamics in isolated gas-phase species, offering insights into fundamental ionization and fragmentation processes. These results demonstrate that the MUSTACHE setup is a powerful tool for high-resolution electron-ion coincidence spectroscopy, extending advanced coincidence techniques into the hard X-ray regime and providing unprecedented opportunities for studying high-energy X-ray-induced phenomena.