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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Alireza Ghasemifard1,2,3, Agnieszka B Kuc2,3, Thomas Heine1,2,3,4
1Theoretical Chemistry, TU Dresden, Bergstraße 66c, 01062 Dresden, Germany.
Molybdenum disulfide (MoS2) thin films show tunable electronic properties due to edge states and flake overlaps. Simulations reveal how these factors control conductivity, enabling optimized material design for nanoelectronics.
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