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A Novel Spatter Detection Algorithm for Real-Time Quality Control in Laser-Directed Energy Deposition-Based Additive
Farzaneh Kaji1, Jinoop Arackal Narayanan2, Mark Zimny3
1Multi-Scale Additive Manufacturing Laboratory, Department of Mechanical and Mechatronics Engineering, University of Waterloo, Waterloo, ON N2L 3G1, Canada.
This study introduces a vision monitoring system to analyze spatter formation during Laser-Directed Energy Deposition (LDED). The developed image processing accurately quantifies spatters, correlating them with process parameters to predict part quality.
Area of Science:
- Additive Manufacturing
- Materials Science
- Process Monitoring
Background:
- Laser-Directed Energy Deposition (LDED) is crucial for 3D metal printing and part repair.
- Melt pool stability and spatter behavior are key performance indicators in LDED.
- Effective monitoring is needed to ensure high-quality deposition.
Purpose of the Study:
- To develop and validate an image processing system for characterizing spatter formation in LDED.
- To correlate spatter characteristics with LDED process parameters.
- To assess the impact of spatters on deposition continuity and predict part quality.
Main Methods:
- An off-axis vision monitoring system with a high-dynamic-range camera and bandpass filter was used.
- A novel image processing algorithm quantified spatter count, orientation, area, and distance.
- Experiments were conducted on a 1 kW fiber laser-based LDED system.
Main Results:
- The image processing algorithm achieved over 93% detection accuracy in harsh conditions.
- A strong positive correlation was found between laser power and average spatter count.
- Spatter detection was successfully used to evaluate deposition continuity.
Conclusions:
- The developed vision system and image processing pipeline provide a robust method for monitoring LDED.
- This approach enables the correlation of spatter formation with process parameters.
- It offers a pathway for predicting and improving the quality of 3D-printed metal components.
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