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Updated: May 14, 2026

Atomically Traceable Nanostructure Fabrication
Published on: July 17, 2015
Christina Glader1, Ramona Jeitler2, Yan Wang3
1Research Center Pharmaceutical Engineering GmbH, Inffeldgasse 13, 8010 Graz, Austria.
This study shows how Dynamic Light Scattering (DLS) and spatially resolved DLS (SR-DLS) can be used as Process Analytical Technology (PAT) tools for real-time nanoparticle size monitoring in continuous manufacturing.
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