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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Haksung Lee1, Man Kwon Choi2, Seong-Hyun Kang3,4
1Reclaimed Land Agricultural Research Center, National Institute of Crop and Food Science, RDA, Wanju 55365, Republic of Korea.
Electroless nickel plating on fiber composites improves electromagnetic interference shielding. Post-heat treatment enhances conductivity and shielding effectiveness, but requires careful control to maintain structural integrity.
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