Related Experiment Video
Updated: Sep 17, 2025

Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping
Published on: June 3, 2015
Single-Qubit Gates with Errors at the 10^{-7} Level
M C Smith1, A D Leu1, K Miyanishi1,2
1University of Oxford, Clarendon Laboratory, Department of Physics, Parks Road, Oxford OX1 3PU, United Kingdom.
Researchers achieved single-qubit gates with error rates below one in a million using a trapped-ion qubit. This breakthrough in quantum computing demonstrates high fidelity and explores speed-fidelity trade-offs for future applications.
Area of Science:
- Quantum Computing
- Atomic Physics
- Quantum Information Science
Background:
- Trapped-ion qubits are promising platforms for quantum computation.
- Achieving high-fidelity single-qubit gates is crucial for scalable quantum computers.
- Minimizing errors from decoherence, leakage, and measurement is essential.
Purpose of the Study:
- To demonstrate single-qubit gates with sub-part-per-million error rates.
- To investigate the trade-off between gate speed and fidelity in a trapped-ion system.
- To identify and quantify dominant error sources in the qubit operations.
Main Methods:
- Utilized a ^{43}Ca^{+} hyperfine clock qubit in a surface-electrode trap.
- Employed chip-integrated microwave resonators for electronic qubit control.
- Explored gate times ranging from 4.4 to 35 microseconds.
Main Results:
- Achieved single-qubit gates with error rates below 1.5(4)×10^{-7} per Clifford gate.
- Suppressed calibration errors to below 10^{-8}.
- Identified qubit decoherence (T_{2}≈70s), leakage, and measurement as primary error sources.
Conclusions:
- Single-qubit gates with unprecedented fidelity have been realized in a trapped-ion system.
- The experimental setup operates at room temperature without magnetic shielding.
- Further improvements require addressing decoherence, leakage, and measurement errors for advanced quantum computing.
Related Concept Videos
Detection of Gross Error: The Q Test
Propagation of Uncertainty from Systematic Error
Propagation of Uncertainty from Random Error
Types of Errors: Detection and Minimization
Absolute error in a measurement is the numerical difference from the true or central value. Relative error is the ratio between absolute error and the true or central value, expressed as a percentage.
Errors can be classified by source, magnitude, and sign. There are three types of errors: systematic, random, and gross.
Systematic or...
NMR Spectrometers: Resolution and Error Correction
Random and Systematic Errors

