X-ray Crystallography
The de Broglie Wavelength
X-ray Diffraction of Biological Samples
¹³C NMR: Distortionless Enhancement by Polarization Transfer (DEPT)
Scanning Electron Microscopy
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Updated: Sep 17, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Weixiao Lin1,2, Zefan Xue1,2, Wenjun Cui1,2
1State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan, China.
Quantitative convergent beam electron diffraction (QCBED) now accurately measures disorder in materials. This electron density method reveals chemical disordering increases lattice vibrations but minimally affects electron density distribution.
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