Fermi Level Dynamics
Interfacial Electrochemical Methods: Overview
Ferromagnetism
Fermi Level
Dielectric Polarization in a Capacitor
Electrostatic Boundary Conditions in Dielectrics
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Updated: Sep 17, 2025

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
Jinlin Wang1, Yun-Qin Li2, Rui Wang1
1State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Frontier Science Center for Nano-optoelectronics and School of Physics, Peking University, Beijing, 100871, China.
Interfacial dead layers in wurtzite ferroelectrics like ScAlN are caused by nitrogen vacancies and strain. Engineering defects and strain is key for next-generation electronics.
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