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Updated: Sep 16, 2025

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
Published on: April 4, 2017
Raphael Wilhelmer1, Fabian Laurent2, Tatjana Djuric-Rissner3
1Materials Center Leoben Forschung GmbH, Leoben, Austria.
This study introduces an AI-powered workflow combining scanning acoustic microscopy with machine learning for rapid defect detection in microelectronics. The method significantly speeds up the analysis of defects for improved semiconductor manufacturing and quantum computing advancements.
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