Related Experiment Video
Updated: Sep 16, 2025

Visualization of DNA Repair Proteins Interaction by Immunofluorescence
Published on: June 26, 2020
Low-energy pathways lead to self-healing defects in CsPbBr3
Kumar Miskin1, Yi Cao2, Madaline Marland2
1Department of Materials Science and Engineering, Johns Hopkins University, USA. kmiskin1@jh.edu.
Abstract:
Self-regulation of free charge carriers in perovskites via Schottky defect formation has been posited as the origin of the well-known defect-tolerance of metal halide perovskite materials. Understanding the mechanisms of self-regulation promises to lead to the fabrication of better performing solar cell materials with higher efficiencies. We investigate many such mechanisms here for CsPbBr3, a popular representative of a more commercially viable all-inorganic metal halide perovskite. We investigate different atomic-level mechanisms and pathways of the diffusion and recombination of neutral and charged interstitials and vacancies (Schottky pairs) in CsPbBr3. We use nudged elastic band calculations and ab initio-derived pseudopotentials within quantum ESPRESSO to determine energies of formation and migration and hence the activation energies for these defects. While halide vacancies are known to exhibit low formation energies, the migration of interstitials is less studied. Our calculations uncover interstitial defect pathways capable of producing an activation energy at, or below, the single experimental value of 0.53 eV observed for the slow, temperature-dependent recovery of light-induced conductivity in bulk CsPbBr3. Our work reveals the existence of a low-energy diffusion pathway involving a concerted "domino effect" of interstitials, with the net result that interstitials can diffuse more readily over longer distances than expected. This observation suggests that defect self-healing can be promoted if the "domino effect" strategy can be engaged.
More Related Videos
06:59Using Next Generation Sequencing to Identify Mutations Associated with Repair of a CAS9-induced Double Strand Break Near the CD4 Promoter
Published on: March 31, 2022
11:14Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Related Concept Videos
Long-patch Base Excision Repair
Deactivation Processes: Jablonski Diagram
P-N junction
Fixing Double-strand Breaks