High-resolution alpha-particle spectrometry of ²⁴³Am.

Area of Science:

• Nuclear Physics
• Radiochemistry
• Detector Physics

Background:

• Accurate characterization of alpha particle emission is crucial for nuclear applications.
• Interference from conversion electrons can distort alpha particle energy spectra.
• Silicon semiconductor detectors offer high energy resolution for charged particle detection.

Purpose of the Study:

• To accurately measure alpha particle energies and emission probabilities from a ²⁴³Am source.
• To minimize spectral distortions caused by quasi-coincident conversion electrons.
• To validate the robustness of the measurement technique against geometrical variations.

Main Methods:

• Utilized a planar ion-implanted silicon semiconductor detector for alpha particle detection.
• Employed a magnetic field to deflect interfering conversion electrons.
• Performed measurements at varying source-detector distances to assess geometrical efficiency effects.
• Applied peak shape fitting to determine alpha emission probabilities and uncertainty budgets.

Main Results:

• Achieved an energy resolution of 9-10 keV for detected alpha particles.
• Successfully reduced spectral distortion by deflecting conversion electrons.
• Demonstrated that energy spectra are largely insensitive to variations in geometrical efficiency.
• Determined alpha-particle emission probabilities for ²⁴³Am, with results compared to literature.

Conclusions:

• The developed method enables precise alpha particle spectroscopy of ²⁴³Am.
• The magnetic deflection technique effectively mitigates spectral interference.
• The measurement is robust against changes in experimental geometry, enhancing its reliability.