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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Quantum electrometer for time-resolved material science at the atomic lattice scale.

Gregor Pieplow¹, Cem Güney Torun¹, Charlotta Gurr¹

¹Department of Physics, Humboldt-Universität zu Berlin, 12489, Berlin, Germany.

Nature Communications

|July 11, 2025

Summary

This summary is machine-generated.

We developed a novel electrometer capable of detecting individual charges at the lattice scale with 60 ns resolution. This breakthrough enables detailed analysis of charge traps and noise in materials for advanced technologies.

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Area of Science:

Solid-state physics
Quantum technology
Materials science

Background:

Individual charge detection is vital for low-noise classical and quantum technologies.
Time-resolved charge detection at the lattice scale remains a significant challenge.

Purpose of the Study:

To develop a time-resolved electrometer for lattice-scale charge detection.
To apply this technology to diamond for material analysis and optimization.

Main Methods:

Development of an electrometer with 60 ns acquisition steps.
Utilizing spectroscopy of an optically-active spin defect with non-linear Stark response.
Application to diamond, a key platform in quantum technology.

Main Results:

Distinguished individual charge traps at the lattice scale in diamond.
Quantified the impact of charge traps on transport dynamics and noise.
Enabled analysis of material properties and informed optimization strategies.

Conclusions:

The developed electrometer provides unprecedented time-resolved, lattice-scale charge detection capabilities.
This method offers a pathway to understanding and mitigating noise in quantum materials.
Facilitates material optimization for enhanced performance in high-performance technologies.