You might also read
Related Articles
Articles linked to this work by shared authors, journal, and citation graph.
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Sep 16, 2025

Cross-Modal Multivariate Pattern Analysis
Published on: November 9, 2011
Haowen Lan1, Jiaxiang Luo1, Hualiang Zhang2
1School of Automation Science and Engineering, South China University of Technology, Guangzhou 510640, China.
This study introduces CM-YOLO, a new method for printed circuit board defect detection that combines RGB and depth images. It significantly improves detection accuracy by enhancing feature perception and fusion.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: