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UV-Assisted Charge Neutralization for Reliable XPS Measurements on Insulating Materials

Lei Zhu1, Xuefeng Xu1

  • 1School of Technology, Beijing Forestry University, Beijing 100083, China.

Materials (Basel, Switzerland)
|July 12, 2025
PubMed
Summary

UV light irradiation effectively reduces surface charging during X-ray photoelectron spectroscopy (XPS) analysis. This UV-assisted neutralization method improves spectral stability and sample integrity, offering a promising alternative for reliable XPS measurements.

Keywords:
UVXPScharge neutralizationphotoelectronsurface charging

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