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Published on: January 3, 2014
Identification and fine-mapping of qNCLB3.04 resistant to Northern Corn Leaf Blight
Junhua Wu1, Wencai Yang1, Xiangdong Shi2
1National Key Laboratory of Crop Genetic Improvement, Huazhong Agricultural University, Wuhan, 430070 Hubei China.
Abstract:
Northern Corn Leaf Blight (NCLB), caused by the fungal pathogen Setosphaeria turcica, is a destructive disease on maize. Identification of resistance quantitative trait loci (QTLs) or genes is crucial for breeding maize varieties with durable resistance to NCLB. Although a lot of resistance QTLs against NCLB have been isolated, only a few have been fine-mapped to date. Here, a BC1F1 population was developed from a cross between the resistance line CIMBL75 and the susceptible line Liao3162. This population was inoculated with mixed conidia of six S. turcica races. Through five field trials, five resistance QTLs against NCLB were identified in this BC1F1 population. One of them, qNCLB3.04 on bin3.04, was repeatedly detected across all five trials. It explained 4.8-9.3% of phenotypic variation. Furthermore, the qNCLB3.04 locus was narrowed down to a 5.053 Mb region by using a progeny-based sequential fine-mapping strategy. Hence, qNCLB3.04 holds significant potential for improving maize broad-spectrum resistance against NCLB.
Supplementary Information:
The online version contains supplementary material available at 10.1007/s11032-025-01581-1.
