Electric Field at the Surface of a Conductor
Van der Waals Interactions
Electric Field of Parallel Conducting Plates
Electrostatic Boundary Conditions in Dielectrics
Electric Field of a Non Uniformly Charged Sphere
P-N junction
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Updated: Sep 15, 2025

Probe Type II Band Alignment in One-Dimensional Van Der Waals Heterostructures Using First-Principles Calculations
Published on: October 12, 2019
Dario Mastrippolito1,2, Mariarosa Cavallo1, Erwan Bossavit1,2
1Sorbonne Université, CNRS, Institut des NanoSciences de Paris, 4 Place Jussieu, 75005 Paris, France.
Nanobeam X-ray photoemission imaging maps electric fields in 2D heterostructures. This technique reveals how device geometry and electrical biases influence electric field distribution for optoelectronic applications.
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