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Classification of prestrike types in vacuum interrupter eroded by inrush current based on DC dynamic gap measurement
Pu Chen1, Yun Geng2, Jing Yan1
1State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, Shaanxi Province, People's Republic of China.
This study investigates prestrike characteristics in vacuum interrupters after inrush current erosion. It classifies prestrike types into field emission induced, particle-induced, and combined, offering insights for vacuum circuit breaker controlled switching.
Area of Science:
- Electrical Engineering
- Materials Science
- High Voltage Engineering
Background:
- Prestrike phenomena significantly impact vacuum circuit breaker (VCB) performance during controlled switching.
- Limited research exists on prestrike characteristics and types in vacuum interrupters (VI) post-inrush current erosion.
Purpose of the Study:
- To investigate prestrike characteristics and types in vacuum interrupters after inrush current erosion.
- To develop a novel method for measuring field emission current under DC voltage for this analysis.
Main Methods:
- Employed a novel method for measuring field emission current under DC voltage.
- Conducted experiments to obtain prestrike characteristics, including dispersion and gap.
- Classified prestrike types based on prestrike gap and field emission current.
Main Results:
- Identified and classified three prestrike types: field emission induced prestrike (FEPS), particle-induced prestrike (PPS), and field emission-particle induced prestrike (FE-PPS).
- Determined average prestrike gaps of 1.525 mm (FEPS), 3.809 mm (PPS), and 2.887 mm (FE-PPS).
- Observed minimal field emission current in PPS, while FE-PPS exhibited approximately 48.89% of FEPS field emission current.
Conclusions:
- The study successfully characterized prestrike phenomena in VIs after inrush current erosion.
- Classification of prestrike types provides a framework for understanding their distinct mechanisms.
- Findings are crucial for advancing controlled switching technology in VCBs.
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